Temperature Sensors Integrated into a CMOS Image Sensor

Conference paper (2017)

Authors

A.N. Abarca Prouza Electronic Instrumentation - EEMCS
S. Xie Electronic Instrumentation - EEMCS
Jules Markenhof External organisation
A.J.P.A.M. Theuwissen Harvest Imaging, Electronic Instrumentation - EEMCS
Research Group
Electronic Instrumentation (EEMCS) (TU Delft)
Copyright: © 2017 A.N. Abarca Prouza, S. Xie, Jules Markenhof, A.J.P.A.M. Theuwissen
DOI
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https://doi.org/10.3390/proceedings1040358
Dark current Pixels Bipolar based temperature sensors
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Published Date

2017

Language

English

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Instrumentation

Abstract

In this work, a novel approach is presented for measuring relative temperature variations inside the pixel array of a CMOS image sensor itself. This approach can give important information when compensation for dark (current) fixed pattern noise (FPN) is needed. The test image sensor consists of pixels and temperature sensors pixels (=Tixels). The size of the Tixels is 11 μm × 11 μm. Pixels and Tixels are placed next to each other in the active imaging array and use the same readout circuits. The design and the first measurements of the combined image-temperature sensor are presented.