Temperature Sensors Integrated into a CMOS Image Sensor
A. Abarca Prouza (TU Delft - Electronic Instrumentation)
Shuang Xie (TU Delft - Electronic Instrumentation)
Jules Markenhof (External organisation)
Albert Theuwissen (TU Delft - Electronic Instrumentation, Harvest Imaging)
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Abstract
In this work, a novel approach is presented for measuring relative temperature variations inside the pixel array of a CMOS image sensor itself. This approach can give important information when compensation for dark (current) fixed pattern noise (FPN) is needed. The test image sensor consists of pixels and temperature sensors pixels (=Tixels). The size of the Tixels is 11 μm × 11 μm. Pixels and Tixels are placed next to each other in the active imaging array and use the same readout circuits. The design and the first measurements of the combined image-temperature sensor are presented.
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