Theoretical and practical validation of combined BEM/FEM substrate resistance modeling
Conference Paper
(2002)
Author(s)
E. Schrik (TU Delft - Signal Processing Systems)
PM Dewilde (TU Delft - Signal Processing Systems)
Nick van der Meijs (TU Delft - Signal Processing Systems)
Research Group
Signal Processing Systems
To reference this document use:
https://resolver.tudelft.nl/uuid:04a061c5-1677-4d90-9a7b-b9a3ba18b212
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Publication Year
2002
Research Group
Signal Processing Systems
Pages (from-to)
10-15
ISBN (print)
0-7803-7607-2
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