A 1 × 400 backside-illuminated SPAD sensor with 49.7 ps resolution, 30 pJ/sample TDCs fabricated in 3D CMOS technology for near-infrared optical tomography
Journal Article
(2015)
Author(s)
JM Pavia (External organisation)
M. Scandiuzzo (TU Delft - Signal Processing Systems)
S Lindner (External organisation)
M Wolf (External organisation)
E Charbon (TU Delft - Signal Processing Systems)
Research Group
Signal Processing Systems
DOI related publication
https://doi.org/10.1109/JSSC.2015.2467170
To reference this document use:
https://resolver.tudelft.nl/uuid:04dcfdf7-4905-4877-bbfd-8fca919929b8
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Publication Year
2015
Language
English
Research Group
Signal Processing Systems
Issue number
10
Volume number
50
Pages (from-to)
2406-2418
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