Smart Redundancy Schemes for ANNs against Fault Attacks

Conference Paper (2022)
Author(s)

Troya Çağıl Köylü (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Said Hamdioui (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Mottaqiallah Taouil (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Research Group
Computer Engineering
DOI related publication
https://doi.org/10.1109/ETS54262.2022.9810380 Final published version
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Publication Year
2022
Language
English
Research Group
Computer Engineering
Article number
9810380
Pages (from-to)
1-2
ISBN (print)
978-1-6654-6707-0
ISBN (electronic)
978-1-6654-6706-3
Event
2022 IEEE European Test Symposium (ETS) (2022-05-23 - 2022-05-27), Barcelona, Spain
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Abstract

Artificial neural networks (ANNs) are used to accomplish a variety of tasks, including safety critical ones. Hence, it is important to protect them against faults that can influence decisions during operation. In this paper, we propose smart and low-cost redundancy schemes that protect the most vulnerable ANN parts against fault attacks. Experimental results show that the two proposed smart schemes perform similarly to dual modular redundancy (DMR) at a much lower cost, generally improve on the state of the art, and reach protection levels in the range of 93% to 99%.

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