Charge deep-level transient spectroscopy study of high-energy-electron-beam-irradiated hydrogenated amorphous silicon

Journal article (2006)

Authors

A Klaver Electronic Components, Technology and Materials - EEMCS
V Nádazdy External organisation
M. Zeman Electronic Components, Technology and Materials - EEMCS
R.A.C.M.M. van Swaaij Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2006

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials