Charge deep-level transient spectroscopy study of high-energy-electron-beam-irradiated hydrogenated amorphous silicon
Journal Article
(2006)
Author(s)
A Klaver (TU Delft - Electronic Components, Technology and Materials)
V Nádazdy (External organisation)
Miro Zeman (TU Delft - Electronic Components, Technology and Materials)
Rene Swaaij (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:0d6aa205-07e3-4fd8-8035-3a6bbf62be26
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Publication Year
2006
Research Group
Electronic Components, Technology and Materials
Volume number
89
Pages (from-to)
022119-1-3
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