SPICE modeling of single-grain Si TFTs using BSIMSOI
Conference Paper
(2007)
Author(s)
A Baiano (TU Delft - Electronic Components, Technology and Materials)
Ryoichi Ishihara (TU Delft - Electronic Components, Technology and Materials)
N Karaki (External organisation)
S Inoue (External organisation)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
CIM Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:0e13e1ef-a8b1-47b8-906a-66c286ae19fe
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Publication Year
2007
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-4
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