Position controlled nanowires for infrared single photon emission

Single grain Si TFTs and local electrical properties of CSL boundaries

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration

Single-Grain Si TFTs for flexible electronics and 3D-ICs

Single-grain Si thin film transistors SPICE model, analog and RF circuit applications

Analog and RF design using the mu-Czochralski single grain TFT technology

Microstructure characterization of location-controlled Si-islands crystallized by excimer laser in the mu-Czochralski (grain filter) process

High Performance Single Grain Si TFTs Inside a Location-Controlled Grain by Micro-Czochralski Process with Capping Layer

Single-grain Si TFTs and circuits fabricated through advanced excimer-laser crystallization

SPICE modeling of single-grain Si TFTs using BSIMSOI

Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy

DC modeling of Single-Grain Si TFTs using BSIMSOI

Ingle-Grain Si TFTs and Circuits for Flexible Electronics and 3D-ICs

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope

SPICE modeling of single-grain Si TFTs using TFTs BSIMSOI

Capping layer on thin Si film for ¿-Czochralski process with excimer laser crystallization

Effects of capping layer on grain growth with ¿-Czochralski process during excimer laser crystallization

Influences of the capping layer on the grain growth with micro-Czochralski process during excimer-laser crystallization

Automated digital circuits design based on single-grain si TFTs fabricated through u-Czochralski (grain filter) process