High Performance Single Grain Si TFTs Inside a Location-Controlled Grain by Micro-Czochralski Process with Capping Layer
Journal Article
(2007)
Author(s)
V Rana (TU Delft - Electronic Components, Technology and Materials)
R. Ishihara (TU Delft - Electronic Components, Technology and Materials)
Y Hiroshima (External organisation)
D Abe (External organisation)
S Inoue (External organisation)
T Shimoda (External organisation)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
C.I.M. Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:4e3e78f7-e93f-452b-8eee-0274d1050489
More Info
expand_more
expand_more
Publication Year
2007
Research Group
Electronic Components, Technology and Materials
Issue number
1
Volume number
54
Pages (from-to)
124-130
No files available
Metadata only record. There are no files for this record.