Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy
Conference Paper
(2008)
Authors
N Matsuki (TU Delft - Electronic Components, Technology and Materials)
Ryoichi Ishihara (TU Delft - Electronic Components, Technology and Materials)
A Baiano (TU Delft - Electronic Components, Technology and Materials)
Y Hiroshima (External organisation)
S Inoue (External organisation)
CIM Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/f52aa680-e382-46da-a45f-d5af36e8993a
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Publication Year
2008
Research Group
Electronic Components, Technology and Materials
Bibliographical Note
Not reported in 2008@en
Pages (from-to)
94-99
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