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N Matsuki

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8 records found

Single grain Si TFTs and local electrical properties of CSL boundaries

Conference paper - R. Ishihara, N Matsuki, T Chen, D Danciu, V Rana, Y Hiroshima, S Inoue

Single-Grain Si TFTs for flexible electronics and 3D-ICs

Conference paper - R. Ishihara, A Baiano, N Karak, S Inoue, C.I.M. Beenakker, N. Saputra, M.M. Danesh, N Matsuki, T Chen, V Rana, M He, J..R.. Long, Y Hiroshima

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope

Conference paper - N Matsuki, R. Ishihara, A Baiano, Y Hiroshima, S Inoue, C.I.M. Beenakker

Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy

Conference paper - N Matsuki, R. Ishihara, A Baiano, Y Hiroshima, S Inoue, C.I.M. Beenakker

Direct observation of the electrical activity of coincidence-site lattice boundaries in location-controlled silicon islands using scanning spread resistance microscopy

Journal article - N Matsuki, R. Ishihara, C.I.M. Beenakker

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

Conference paper - N Matsuki, R. Ishihara, A Baiano, Y Hiroshima, S Inoue, C.I.M. Beenakker

Investigation of local electrical properties of coincidence-site-lattice boundaries in location-controlled silicon islands using scanning capacitance microscopy

Journal article - N Matsuki, R. Ishihara, A Baiano, C.I.M. Beenakker

Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy

Conference paper - N Matsuki, R. Ishihara, T Chen, Y Hiroshima, JW Metselaar, C.I.M. Beenakker