Direct observation of the electrical activity of coincidence-site lattice boundaries in location-controlled silicon islands using scanning spread resistance microscopy
Journal Article
(2009)
Author(s)
N Matsuki (TU Delft - Electronic Components, Technology and Materials)
R Ishihara (TU Delft - Electronic Components, Technology and Materials)
CIM Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:bbd807a4-90b0-436d-bb7a-e8a833d7f43d
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Publication Year
2009
Research Group
Electronic Components, Technology and Materials
Issue number
3
Volume number
17
Pages (from-to)
293-297
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