Investigation of local electrical properties of coincidence-site-lattice boundaries in location-controlled silicon islands using scanning capacitance microscopy
Journal Article
(2008)
Author(s)
N Matsuki (TU Delft - Electronic Components, Technology and Materials)
Ryoichi Ishihara (TU Delft - Electronic Components, Technology and Materials)
A Baiano (TU Delft - Electronic Components, Technology and Materials)
Kees Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:fc33eec1-14a3-4496-b4a8-c8f0e0365288
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Publication Year
2008
Research Group
Electronic Components, Technology and Materials
Volume number
93
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