Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope
Conference Paper
(2007)
Author(s)
N Matsuki (TU Delft - Electronic Components, Technology and Materials)
Ryoichi Ishihara (TU Delft - Electronic Components, Technology and Materials)
A Baiano (TU Delft - Electronic Components, Technology and Materials)
Y Hiroshima (External organisation)
S Inoue (External organisation)
CIM Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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Publication Year
2007
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-4
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