Single grain Si TFTs and local electrical properties of CSL boundaries
Conference Paper
(2008)
Author(s)
Ryoichi Ishihara (TU Delft - Electronic Components, Technology and Materials)
N Matsuki (TU Delft - Electronic Components, Technology and Materials)
T Chen (TU Delft - Old - EWI Sect. ECTM)
D Danciu (TU Delft - Electronic Components, Technology and Materials)
V Rana (TU Delft - Electronic Components, Technology and Materials)
Y Hiroshima (External organisation)
S Inoue (External organisation)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:85a2eeef-4bb4-4b14-b33b-c6f93698f047
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Publication Year
2008
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
25-28
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