Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy
Conference Paper
(2007)
Author(s)
N Matsuki (TU Delft - Electronic Components, Technology and Materials)
R Ishihara (TU Delft - Electronic Components, Technology and Materials)
T Chen (TU Delft - Old - EWI Sect. ECTM)
Y Hiroshima (External organisation)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
Kees Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:28b32595-6e32-4343-9759-8fec7a8d73b4
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Publication Year
2007
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
251-253
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