An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration

Journal article (2008)

Authors

N. Saputra Electronics - EEMCS
M.M. Danesh Electronics - EEMCS
A Baiano Electronic Components, Technology and Materials - EEMCS
R. Ishihara Electronic Components, Technology and Materials - EEMCS
J..R.. Long Electronics - EEMCS
N Karaki External organisation
S Inoue External organisation
Research Group
Electronics (EEMCS) (TU Delft)
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Published Date

2008

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronics