An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration

N. Saputra (TU Delft - Electronics)

M.M. Danesh (TU Delft - Electronics)

A Baiano (TU Delft - Electronic Components, Technology and Materials)

R. Ishihara (TU Delft - Electronic Components, Technology and Materials)

J..R.. Long (TU Delft - Electronics)

N Karaki (External organisation)

S Inoue (External organisation)