Self-consistent calculation of shape anisotropy for micropatterned thin FeNi films for on-chip RF applications
Abstract
(2004)
Author(s)
M Vroubel (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
Y Zhuang (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
B. Rajaei Salmasi (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
JN Burghartz (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
A Crawford (External organisation)
S Wang (External organisation)
Research Group
Old - EWI Ch. Integrated Sensing Devices
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Publication Year
2004
Research Group
Old - EWI Ch. Integrated Sensing Devices
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