Self-consistent calculation of shape anisotropy for micropatterned thin FeNi films for on-chip RF applications

Abstract (2004)
Author(s)

M Vroubel (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

Y Zhuang (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

B. Rajaei Salmasi (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

JN Burghartz (TU Delft - Old - EWI Ch. Integrated Sensing Devices)

A Crawford (External organisation)

S Wang (External organisation)

Research Group
Old - EWI Ch. Integrated Sensing Devices
More Info
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Publication Year
2004
Research Group
Old - EWI Ch. Integrated Sensing Devices

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