A Systematic Approach for Reliability Assessment of Electrolytic Capacitor-Free LED Drivers
Bo Sun (TU Delft - Beijing Delft Institute of Intelligent Science and Technology, State Key Laboratory of Solid State Lighting)
Xuejun Fan (Lamar University, State Key Laboratory of Solid State Lighting)
Willem Dirk van Driel (TU Delft - Electronic Components, Technology and Materials, Philips Lighting Research)
Guo Qi Zhang (TU Delft - Electronic Components, Technology and Materials)
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Abstract
In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.
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