A Systematic Approach for Reliability Assessment of Electrolytic Capacitor-Free LED Drivers

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A Systematic Approach for Reliability Assessment of Electrolytic Capacitor-Free LED Drivers

Conference Paper (2016)

Author(s)

Bo Sun (TU Delft - Beijing Delft Institute of Intelligent Science and Technology, State Key Laboratory of Solid State Lighting)

Xuejun Fan (Lamar University, State Key Laboratory of Solid State Lighting)

Willem van Driel (TU Delft - Electrical Engineering, Mathematics and Computer Science, Philips Lighting Research)

Guo Qi Zhang (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Research Group

Electronic Components, Technology and Materials

Reliability MOSFET Electrolytic Capacitor-Free LED Driver

DOI related publication

https://doi.org/10.1109/EuroSimE.2016.7463387 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:1882b073-d190-466a-9343-ce96ded32414

More Info

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Publication Year

2016

Language

English

Research Group

Electronic Components, Technology and Materials

Pages (from-to)

1-5

ISBN (electronic)

978-1-5090-2106-2

Event

EuroSimE 2016 (2016-04-17 - 2016-04-20), Montpellier, France

Downloads counter

99

Abstract

In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.