Characterization of a novel mask imaging algorithm based on the Extended Nijboer Zernike (ENZ) formalism.
Poster
(2008)
Author(s)
S. van Haver (TU Delft - ImPhys/Optics)
O.T.A. Janssen (TU Delft - ImPhys/Optics)
J.J.M. Braat (TU Delft - ImPhys/Optics)
Silvania F. Pereira (TU Delft - ImPhys/Optics)
Research Group
ImPhys/Optics
To reference this document use:
https://resolver.tudelft.nl/uuid:19760ea0-91be-4d21-80f6-394987459a6c
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Publication Year
2008
Research Group
ImPhys/Optics
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