A 6.4 nW 1.7% Relative Inaccuracy CMOS Temperature Sensor Utilizing Sub-thermal Drain Voltage Stabilization and Frequency Locked Loop

Journal Article (2020)
Author(s)

T. Someya (Tokyo Institute of Technology, TU Delft - Electronic Instrumentation)

A. K.M.Mahfuzul Islam (Kyoto University)

Kenichi Okada (Tokyo Institute of Technology)

Research Group
Electronic Instrumentation
Copyright
© 2020 T. Someya, A. K.M.Mahfuzul Islam, Kenichi Okada
DOI related publication
https://doi.org/10.1109/LSSC.2020.3025962
More Info
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Publication Year
2020
Language
English
Copyright
© 2020 T. Someya, A. K.M.Mahfuzul Islam, Kenichi Okada
Research Group
Electronic Instrumentation
Volume number
3
Pages (from-to)
458-461
Reuse Rights

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Abstract

A 6.4 nW 1.7% relative inaccuracy (R-IA) CMOS sub-thermal drain voltage-based temperature sensor is proposed. The proposed stabilized sub-thermal drain voltage current generator achieves a highly linear PTAT output without nonlinearity fitting or post-fabrication trimming and increases the accuracy of the sensor. A combination of the current generator and a frequency-locked loop relaxes the tradeoff between power and temperature stability of the current-to-frequency converter and achieves supply voltage-independent operation. Measured results of the prototype fabricated in a 65-nm CMOS process show that the proposed temperature sensor has a -1.0/+0.7 °C inaccuracy (= R-IA of 1.7%) while achieving a resolution of 75 mK over a temperature range of -30 °C to 70 °C. The line sensitivity of the sensor is 2.8 °C/V.

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