High-temperature bulge-test setup for mechanical testing of free-standing thin films
Journal Article
(2003)
Author(s)
AJ Kalkman (TU Delft - QN/Fysics of NanoElectronics)
A.H. Verbruggen (TU Delft - QN/Fysics of NanoElectronics)
GCAM Janssen (TU Delft - OLD Virtual Materials and Mechanics)
Research Group
QN/Fysics of NanoElectronics
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https://resolver.tudelft.nl/uuid:1f051680-7dbf-47cc-982d-f67e7fa6ea3c
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Publication Year
2003
Research Group
QN/Fysics of NanoElectronics
Issue number
3
Volume number
74
Pages (from-to)
1383-1385
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