Application of Ramon spectrometry for the characterization of complexed oxide thin films grown by MOCVD.
Journal Article
(1999)
Author(s)
B Guttler (External organisation)
OY Gorbenko (External organisation)
MA Samoilenkov (External organisation)
VA Amelichev (External organisation)
G Wahl (External organisation)
HW Zandbergen (TU Delft - OLD Virtual Materials and Mechanics)
Research Group
OLD Virtual Materials and Mechanics
To reference this document use:
https://resolver.tudelft.nl/uuid:26865d12-3723-4013-bab0-e2099b0d6e07
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Publication Year
1999
Research Group
OLD Virtual Materials and Mechanics
Volume number
9
Pages (from-to)
1179-1186
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