Application of Ramon spectrometry for the characterization of complexed oxide thin films grown by MOCVD.

Journal article (1999)

Authors

B Guttler External organisation
OY Gorbenko External organisation
MA Samoilenkov External organisation
VA Amelichev External organisation
G Wahl External organisation
H.W. Zandbergen OLD Virtual Materials and Mechanics
Research Group
OLD Virtual Materials and Mechanics
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Published Date

1999

Language

Undefined/Unknown

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Research Group

OLD Virtual Materials and Mechanics

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