Flux-creep and critical currents in various Y-Ba-Cu-O-samples

Journal Article (1988)
Author(s)

C.W. Hagen (Vrije Universiteit Amsterdam)

M. R. Bom (Vrije Universiteit Amsterdam)

R. Griessen (Vrije Universiteit Amsterdam)

B. Dam (Philips Research Laboratories)

HJ Veringa (ECN, Petten)

Affiliation
External organisation
DOI related publication
https://doi.org/10.1016/0921-4534(88)90613-2
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Publication Year
1988
Language
English
Affiliation
External organisation
Issue number
Part 1
Volume number
153-155
Pages (from-to)
322-323

Abstract

Using contactless torque measurements in magnetic fields up to 10 T we have investigated the flux-creep rate and critical currents of three types of Y1Ba2Cu3O≈7-samples: ceramic bulk, triode sputtered films and ceramic foils (thickness 700 μm) consisting of superconducting grains embedded in a polymer. The highest Jc≌ 2. 106 A/cm2 is found for a 250 nm thick film sputtered on SrTiO with the c-axis perpendicular to the substrate. The creep-rate is strongly temperature dependent and is well described by a Kohlrausch behaviour (∝ exp −(t/t0)β with β ≅1/3.

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