Calculation of shape anisotropy for micropatterned thin Fe-Ni films for on-chip RF applications
Journal Article
(2004)
Author(s)
M Vroubel (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
Y Zhuang (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
B. Rajaei Salmasi (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
JN Burghartz (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
A Crawford (External organisation)
S Wang (External organisation)
Research Group
Old - EWI Ch. Integrated Sensing Devices
To reference this document use:
https://resolver.tudelft.nl/uuid:2858c7f3-a3ae-4cb5-80b4-a1de0469e319
More Info
expand_more
expand_more
Publication Year
2004
Research Group
Old - EWI Ch. Integrated Sensing Devices
Issue number
4
Volume number
40
Pages (from-to)
2835-2837
No files available
Metadata only record. There are no files for this record.