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Reliability, Test, and Security of Compute-In-Memories

Conference Paper (2026)
Author(s)

Soyed Tuhin Ahmed (Arizona State University)

Krishnendu Chakrabarty (Arizona State University)

Jin Fu Li (National Central University Taiwan)

Mottaqiallah Taouil (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Fouwad Jamil Mir (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Said Hamdioui (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Mehdi Tahoori (Karlsruhe Institut für Technologie)

Martin Keim (Siemens EDA)

Jongsin Yun (Siemens EDA)

Research Group
Computer Engineering
DOI related publication
https://doi.org/10.1109/ETS69887.2026.11591683 Final published version
More Info
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Publication Year
2026
Language
English
Research Group
Computer Engineering
Publisher
IEEE
ISBN (electronic)
9798319517630
Event
31st IEEE European Test Symposium, ETS 2026 (2026-05-25 - 2026-05-29), Chania, Greece
Page Views
67
Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Abstract

Compute-in-Memory (CiM) devices have several attributes that make them of interest especially for accelerating artificial intelligence workloads and, at the same time, reduce power consumption. Both are critical aspects of edge computing. This paper summarizes a 3-topic special session held at the European Test Symposium 2026 on the topic of CiMs: (a) concerning the reliability of CiMs, (b) the testing of CiMs, and finally (c) on the security of CiMs.

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