Reliability of single-grain silicon TFTs fabricated from spin-coated liquid-silicon
Conference Paper
(2012)
Author(s)
J Zhang (TU Delft - Electronic Components, Technology and Materials)
R. Ishihara (TU Delft - Electronic Components, Technology and Materials)
H Takagishi (External organisation)
R Kawajiri (External organisation)
T Shimoda (External organisation)
C.I.M. Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:338eaacd-fa16-470e-8492-6f0cae58b2f2
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Publication Year
2012
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
309-312
ISBN (print)
978-1-4673-0399-6
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