Exploring test opportunities for memory and interconnects in 3D ICs
Conference Paper
(2012)
Author(s)
Mottagiallah Taouil (TU Delft - Computer Engineering)
M. Lefter (TU Delft - Computer Engineering)
S. Hamdioui (TU Delft - Computer Engineering)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:3455f6f4-9aea-428f-88b6-3c9f977809d9
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Publication Year
2012
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-6
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