Temporal Noise Reduction in CMOS Image Sensors

Doctoral thesis (2021)

Authors

X. Ge Electronic Instrumentation - EEMCS
Research Group
Electronic Instrumentation (EEMCS) (TU Delft)
Copyright: © 2021 X. Ge
DOI: https://doi.org/10.4233/uuid:386c834b-a534-4c0e-8710-1234cfd6bd9e
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Published Date

2021

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Instrumentation

Abstract

In pursuit of achieving the noise condition of single-photon imaging, system-level and circuit-level innovations and optimizations for CMOS image sensor (CIS) noise reduction are called for. Stimulated by this motivation, this thesis focuses on reducing the temporal noise generated in the pixels and the readout electronics.