Temporal Noise Reduction in CMOS Image Sensors
Doctoral Thesis
(2021)
Author(s)
X Ge (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
Copyright
© 2021 X. Ge
To reference this document use:
https://doi.org/10.4233/uuid:386c834b-a534-4c0e-8710-1234cfd6bd9e
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Publication Year
2021
Language
English
Copyright
© 2021 X. Ge
Research Group
Electronic Instrumentation
ISBN (print)
978-94-6416-807-5
Reuse Rights
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Abstract
In pursuit of achieving the noise condition of single-photon imaging, system-level and circuit-level innovations and optimizations for CMOS image sensor (CIS) noise reduction are called for. Stimulated by this motivation, this thesis focuses on reducing the temporal noise generated in the pixels and the readout electronics.