Bulk-Micromachined Test Structure for Fast and Reliable Determination of the Lateral Thermal Conductivity of Thin Films

Journal article (2007)

Authors

L. La Spina Electronic Components, Technology and Materials - EEMCS
AW van Herwaarden External organisation
H. Schellevis Electronic Components, Technology and Materials - EEMCS
W.H.A. Wien Electronic Components, Technology and Materials - EEMCS
N Nenadovi¿ External organisation
L.K. Nanver Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2007

Language

Undefined/Unknown

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials