Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application
Conference Paper
(2012)
Author(s)
L. Shi (TU Delft - Electronic Components, Technology and Materials)
Stoyan Nihtianov (TU Delft - Electronic Instrumentation)
F Scholze (External organisation)
L. K. Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/IECON.2012.6389260
To reference this document use:
https://resolver.tudelft.nl/uuid:3bc0b6cd-9637-4ea2-b2d8-2e5d6eb808e0
More Info
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Publication Year
2012
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
3952-3957
ISBN (print)
978-1-4673-2419-9
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