Analyzing the impact of process variations on DRAM testing using border resistance traces

Conference paper (2003)

Authors

Z. Al-Ars Computer Engineering - EEMCS
AJ van de Goor Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
More Info
expand_more

Published Date

2003

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering