Electrical characterization of carbon nanotube vertical interconnects with different lengths and widths
Conference Paper
(2012)
Author(s)
Sten Vollebregt (TU Delft - Electronic Components, Technology and Materials)
Ryoichi Ishihara (TU Delft - Electronic Components, Technology and Materials)
F. D. Tichelaar (QN/High Resolution Electron Microscopy)
J. van der Cingel (TU Delft - Electronic Components, Technology and Materials)
CIM Beenakker (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/IITC.2012.6251578
To reference this document use:
https://resolver.tudelft.nl/uuid:3c57ffd3-1fda-4cce-b6a4-f53b3ff1048c
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Publication Year
2012
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-3
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