Electrical characterization of carbon nanotube vertical interconnects with different lengths and widths

Conference Paper (2012)
Author(s)

Sten Vollebregt (TU Delft - Electronic Components, Technology and Materials)

Ryoichi Ishihara (TU Delft - Electronic Components, Technology and Materials)

F. D. Tichelaar (QN/High Resolution Electron Microscopy)

J. van der Cingel (TU Delft - Electronic Components, Technology and Materials)

CIM Beenakker (TU Delft - Electronic Components, Technology and Materials)

Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/IITC.2012.6251578
More Info
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Publication Year
2012
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-3

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