Electromigration eliability study of a GMR spin valve device, Materials Reliability in Microelectronics IX.
Conference Paper
(1999)
Author(s)
S Shingubara (External organisation)
Y Takeda (External organisation)
H Sakue (External organisation)
T Takahagi (External organisation)
A.H. Verbruggen (TU Delft - QN/Fysics of NanoElectronics)
Research Group
QN/Fysics of NanoElectronics
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https://resolver.tudelft.nl/uuid:413aa4ee-e45c-42c2-8b02-f1271ea56fb8
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Publication Year
1999
Research Group
QN/Fysics of NanoElectronics
Pages (from-to)
145-150
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