Electromigration eliability study of a GMR spin valve device, Materials Reliability in Microelectronics IX.

Shingubara, S; Takeda, Y; Sakue, H; Takahagi, T; Verbruggen, A.H.

Electromigration eliability study of a GMR spin valve device, Materials Reliability in Microelectronics IX.

Conference paper (1999)

Authors

S Shingubara External organisation

Y Takeda External organisation

H Sakue External organisation

T Takahagi External organisation

A.H. Verbruggen QN/Fysics of NanoElectronics

Research Group

QN/Fysics of NanoElectronics

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Published Date

1999

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Research Group

QN/Fysics of NanoElectronics

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