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S Shingubara
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Authored
2 records found
Multiprobe resistance monitoring of Blech pattern during electromigration testing.
Conference paper -
S Shingubara
,
T Osaka
,
H Sakaue
,
T Takahagi
,
A.H. Verbruggen
Electromigration eliability study of a GMR spin valve device, Materials Reliability in Microelectronics IX.
Conference paper -
S Shingubara
,
Y Takeda
,
H Sakue
,
T Takahagi
,
A.H. Verbruggen