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S Shingubara

Conference paper (2)

2 records found

1

Multiprobe resistance monitoring of Blech pattern during electromigration testing.

Conference paper (1999) - S Shingubara (author) , T Osaka (author) , H Sakaue (author) , T Takahagi (author) , A.H. Verbruggen (author)

Electromigration eliability study of a GMR spin valve device, Materials Reliability in Microelectronics IX.

Conference paper (1999) - S Shingubara (author) , Y Takeda (author) , H Sakue (author) , T Takahagi (author) , A.H. Verbruggen (author)