3D Microscopy Deconvolution of Very Large Images with an Adaptive Resolution Scheme

Master Thesis (2024)
Author(s)

C. Ge (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Contributor(s)

A-J. van der van der Veen – Mentor (TU Delft - Signal Processing Systems)

G. Joseph – Graduation committee member (TU Delft - Signal Processing Systems)

Daniel Sage – Mentor (EPFL Switzerland)

Vasiliki Stergiopoulou – Mentor (EPFL Switzerland)

Joan Rue Queralt – Mentor (EPFL Switzerland)

Faculty
Electrical Engineering, Mathematics and Computer Science
More Info
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Publication Year
2024
Language
English
Graduation Date
14-10-2024
Awarding Institution
Delft University of Technology
Programme
['Electrical Engineering']
Sponsors
EPFL Switzerland
Faculty
Electrical Engineering, Mathematics and Computer Science
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Abstract

Microscopy is a crucial tool across various scientific domains. Due to light diffraction, the images acquired from optical microscopes are usually blurry and corrupted by noise. For an accurate quantitative analysis, the measured images need to be deconvolved to achieve higher resolution. Deconvolution processes are computationally expensive, due to the large data size. This leads to out-of-memory issues and extended computation time.

To address these problems, this project aims to develop a novel convolution scheme. It utilizes the special structure of the Point Spread Function, which in conventional microscopy techniques has most of its energy concentrated in the center. And implement multi-resolution signal processing methods. This approach enhances computational efficiency while retaining computational accuracy.

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ChangGe_thesis.pdf
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