Combined BEM/FEM vs. 3DFEM substrate resistance modeling
Conference Paper
(2004)
Author(s)
E. Schrik (TU Delft - Signal Processing Systems)
Nick van der Meijs (TU Delft - Signal Processing Systems)
Research Group
Signal Processing Systems
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https://resolver.tudelft.nl/uuid:4cc3df3e-3b48-4c49-9fe4-70c121fb93b3
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Publication Year
2004
Research Group
Signal Processing Systems
Pages (from-to)
435-441
ISBN (print)
90-73461-43-X
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