A Precision Capacitance-to-Digital Converter with 16.7-bit ENOB and 7.5 ppm/°C Thermal Drift

Journal Article (2017)
Author(s)

R. Yang (TU Delft - Electronic Instrumentation)

M. Pertijs (TU Delft - Electronic Instrumentation)

S. Nihtianova (TU Delft - Electronic Instrumentation)

Research Group
Electronic Instrumentation
DOI related publication
https://doi.org/10.1109/jssc.2017.2734900
More Info
expand_more
Publication Year
2017
Language
English
Research Group
Electronic Instrumentation
Issue number
11
Volume number
52
Pages (from-to)
3018-3031

Abstract

This paper presents a high-precision capacitance-to-digital converter (CDC) for displacement measurement in advanced industrial applications, based on a charge-balancing third-order delta–sigma modulator. To achieve high precision, this CDC employs a precision external resistive reference and a quartz-oscillator-based time reference instead of a reference capacitor. To minimize the error contribution of the CDC circuitry, various precision circuit techniques, such as chopping and auto-zeroing, are applied at both system and circuit level. Measurement results of the prototype realized in 0.35-μm CMOS technology show that the CDC achieves an rms resolution of 42 aF across a capacitance range from 6 to 22 pF, corresponding to an effective number of bits (ENOB) of 16.7 bit. The conversion time for one measurement is 10.5 ms, during which the CDC consumes 230 μA from a 3.3-V single supply. The measured thermal stability is within ±7.5 ppm/°C across a temperature range from 20 °C to 70 °C, which represents a significant improvement compared to the state of the art. After a two-point calibration, all ten measured samples from one batch show absolute accuracy below ±25 fF across the entire capacitance measurement range.

No files available

Metadata only record. There are no files for this record.