A CMOS image sensor with row and column profiling means
Conference Paper
(2008)
Author(s)
N Xie (TU Delft - Electronic Instrumentation)
A.J.P.A.M. Theuwissen (TU Delft - Electronic Instrumentation)
X Wang (TU Delft - Electronic Instrumentation)
J Leijtens (External organisation)
H Hakkesteegt (External organisation)
H. Jansen (External organisation)
Research Group
Electronic Instrumentation
To reference this document use:
https://resolver.tudelft.nl/uuid:536055b9-c792-4fd5-a5b9-efee78310bfe
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Publication Year
2008
Research Group
Electronic Instrumentation
Pages (from-to)
1356-1359
ISBN (print)
978-1-4244-2581-5
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