Interface Characterization and Failure Modeling for Semiconductor Packages
Conference Paper
(2008)
Author(s)
L.J. Ernst (TU Delft - Computational Design and Mechanics)
A. Xiao (TU Delft - Computational Design and Mechanics)
B Wunderle (External organisation)
K. M.B. Jansen (TU Delft - Computational Design and Mechanics)
H Pape (External organisation)
Research Group
Computational Design and Mechanics
To reference this document use:
https://resolver.tudelft.nl/uuid:55b53b70-24aa-4864-893f-cfb7897e6808
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Publication Year
2008
Research Group
Computational Design and Mechanics
Pages (from-to)
808-815
ISBN (print)
978-1-4244-2117-9
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