A 5800-μm2 Resistor-Based Temperature Sensor with a One-Point Trimmed Inaccuracy of ±1.2 °c (3σ) from -50 °c to 105 °c in 65-nm CMOS

Conference Paper (2019)
Author(s)

Yongtae Lee (Yonsei University)

Woojun Choi (Yonsei University)

Taewoong Kim (Yonsei University)

Seungwoo Song (Yonsei University)

Kofi A.A. Makinwa (TU Delft - Microelectronics)

Youngcheol Chae (Yonsei University)

Department
Microelectronics
Copyright
© 2019 Yongtae Lee, Woojun Choi, Taewoong Kim, Seungwoo Song, K.A.A. Makinwa, Youngcheol Chae
DOI related publication
https://doi.org/10.1109/ESSCIRC.2019.8902650
More Info
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Publication Year
2019
Language
English
Copyright
© 2019 Yongtae Lee, Woojun Choi, Taewoong Kim, Seungwoo Song, K.A.A. Makinwa, Youngcheol Chae
Department
Microelectronics
Pages (from-to)
67-70
ISBN (electronic)
9781728115504
Reuse Rights

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Abstract

This letter describes a compact resistor-based temperature sensor intended for the thermal monitoring of microprocessors and DRAMs. It consists of an RC poly phase filter (PPF) that is read out by a frequency-locked loop (FLL) based on a dual zero-crossing (ZC) detection scheme. The sensor,fabricated in 65-nm CMOS,occupies 5800 μm2 and achieves moderate accuracy [±1.2 °C (3σ)] over a wide temperature range (-50 °C to 105 °C) after a one-point trim. This is 2× better than the previous compact resistor-based sensors. Operating from 0.85 to 1.3-V supplies,it consumes 32.5-μA and achieves 2.8-mK resolution in a 1-ms conversion time,which corresponds to a resolution FoM of 0.26 pJ•K2.

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