A 5800-μm2 Resistor-Based Temperature Sensor with a One-Point Trimmed Inaccuracy of ±1.2 °c (3σ) from -50 °c to 105 °c in 65-nm CMOS

Conference paper (2019)

Authors

Yongtae Lee Yonsei University
Woojun Choi Yonsei University
Taewoong Kim Yonsei University
Seungwoo Song Yonsei University
K.A.A. Makinwa Microelectronics
Youngcheol Chae Yonsei University
Department
Microelectronics
Copyright: © 2019 Yongtae Lee, Woojun Choi, Taewoong Kim, Seungwoo Song, K.A.A. Makinwa, Youngcheol Chae
DOI: https://doi.org/10.1109/ESSCIRC.2019.8902650
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Published Date

2019

Language

English

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Department

Microelectronics

Abstract

This letter describes a compact resistor-based temperature sensor intended for the thermal monitoring of microprocessors and DRAMs. It consists of an RC poly phase filter (PPF) that is read out by a frequency-locked loop (FLL) based on a dual zero-crossing (ZC) detection scheme. The sensor,fabricated in 65-nm CMOS,occupies 5800 μm2 and achieves moderate accuracy [±1.2 °C (3σ)] over a wide temperature range (-50 °C to 105 °C) after a one-point trim. This is 2× better than the previous compact resistor-based sensors. Operating from 0.85 to 1.3-V supplies,it consumes 32.5-μA and achieves 2.8-mK resolution in a 1-ms conversion time,which corresponds to a resolution FoM of 0.26 pJ•K2.

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