Thermal transient effect and improved junction temperature measurement method in high-voltage light-emitting diodes
Journal Article
(2013)
Author(s)
H.Y. Ye (TU Delft - Electronic Components, Technology and Materials)
X Chen (External organisation)
H.W. van Zeijl (TU Delft - Electronic Components, Technology and Materials)
AWJ Gielen (External organisation)
Guo Qi Zhang (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/LED.2013.2274473
To reference this document use:
https://resolver.tudelft.nl/uuid:570ecb5e-70fa-4dea-9535-4fb922edccc4
More Info
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Publication Year
2013
Language
English
Research Group
Electronic Components, Technology and Materials
Issue number
9
Volume number
34
Pages (from-to)
1172-1174
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