Analysis of SESANS data by numerical Hankel transform implementation in SasView

Journal Article (2020)
Author(s)

J.H. Bakker (TU Delft - RST/Neutron and Positron Methods in Materials, TU Delft - RST/Radiation, Science and Technology)

Adam L. Washington (Rutherford Appleton Laboratory)

S. R. Parnell (TU Delft - RID/TS/Instrumenten groep, TU Delft - RST/Radiation, Science and Technology)

A. A. van Well (TU Delft - RID/Algemeen/Bedrijfsondersteuning, TU Delft - RST/Radiation, Science and Technology)

C. Pappas (TU Delft - RST/Radiation, Science and Technology, TU Delft - RST/Neutron and Positron Methods in Materials)

Wim G. Bouwman (TU Delft - RST/Radiation, Science and Technology, TU Delft - RST/Neutron and Positron Methods in Materials)

Research Group
RST/Neutron and Positron Methods in Materials
Copyright
© 2020 J.H. Bakker, Adam L. Washington, S.R. Parnell, A.A. van Well, C. Pappas, W.G. Bouwman
DOI related publication
https://doi.org/10.3233/jnr-200154
More Info
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Publication Year
2020
Language
English
Copyright
© 2020 J.H. Bakker, Adam L. Washington, S.R. Parnell, A.A. van Well, C. Pappas, W.G. Bouwman
Research Group
RST/Neutron and Positron Methods in Materials
Issue number
1
Volume number
22
Pages (from-to)
57-70
Reuse Rights

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Abstract

SESANS data analysis has been implemented in the SasView software package, allowing SESANS experiments to be analyzed using a numerical Hankel transformation of isotropic small-angle scattering (SAS) models. The error of the numerical approximation is three orders of magnitude below typical experimental errors. All advanced data fitting features of SasView (multi-model fitting, batch fitting, and simultaneous/constrained fitting) are now also available for SESANS and this is demonstrated by examples of fitting SAS models to SESANS measurements.