Analysis of SESANS data by numerical Hankel transform implementation in SasView
Jurrian H. Bakker (TU Delft - Applied Sciences, TU Delft - Applied Sciences)
Adam L. Washington (Rutherford Appleton Laboratory)
Steven R. Parnell (TU Delft - RID/TS/Instrumenten groep, TU Delft - Applied Sciences)
Ad A. Van Well (TU Delft - RID/Algemeen/Bedrijfsondersteuning, TU Delft - Applied Sciences)
Catherine Pappas (TU Delft - Applied Sciences, TU Delft - Applied Sciences)
Wim G. Bouwman (TU Delft - Applied Sciences, TU Delft - Applied Sciences)
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Abstract
SESANS data analysis has been implemented in the SasView software package, allowing SESANS experiments to be analyzed using a numerical Hankel transformation of isotropic small-angle scattering (SAS) models. The error of the numerical approximation is three orders of magnitude below typical experimental errors. All advanced data fitting features of SasView (multi-model fitting, batch fitting, and simultaneous/constrained fitting) are now also available for SESANS and this is demonstrated by examples of fitting SAS models to SESANS measurements.
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