March LA

A test for linked memory faults

Journal article (1997)

Authors

A.J. van de Goor Computer Engineering - EEMCS
G. Gaydadjiev Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

1997

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering

Abstract

A test is presented for detecting simple memory faults as well as linked memory faults. It assumes the multiple linked faults as a set of involved simple faults and guarantees their detection by detecting the simple faults belonging to the set.