March LA
A test for linked memory faults
Journal Article
(1997)
Author(s)
AJ van de Goor (TU Delft - Computer Engineering)
G. N. Gaydadjiev (TU Delft - Computer Engineering)
Research Group
Computer Engineering
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Publication Year
1997
Language
English
Research Group
Computer Engineering
Pages (from-to)
627
Abstract
A test is presented for detecting simple memory faults as well as linked memory faults. It assumes the multiple linked faults as a set of involved simple faults and guarantees their detection by detecting the simple faults belonging to the set.
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