RF-noise modeling in MOSFETs: Excess noise, symmetry, and causality

Conference paper (2014)

Authors

GDJ Smit External organisation
AJ Scholten External organisation
RMT Pijper External organisation
LF Tiemeijer External organisation
R. van der Toorn Mathematical Physics - EEMCS
D.B.M. Klaassen External organisation
P Scheer External organisation
A Juge External organisation
Research Group
Mathematical Physics (EEMCS) (TU Delft)
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Published Date

2014

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Delft Institute of Applied Mathematics

Research Group

Mathematical Physics