RF-noise modeling in MOSFETs: Excess noise, symmetry, and causality
Conference Paper
(2014)
Author(s)
GDJ Smit (External organisation)
AJ Scholten (External organisation)
RMT Pijper (External organisation)
LF Tiemeijer (External organisation)
R. van der Toorn (TU Delft - Mathematical Physics)
D.B.M. Klaassen (External organisation)
P Scheer (External organisation)
A Juge (External organisation)
Research Group
Mathematical Physics
To reference this document use:
https://resolver.tudelft.nl/uuid:5d4b2997-6eff-4f18-b034-de7a620dd6cd
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Publication Year
2014
Language
English
Research Group
Mathematical Physics
Pages (from-to)
503-507
ISBN (print)
978-1-4822-5827-1
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