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P Scheer
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RF-noise modeling in MOSFETs: Excess noise, symmetry, and causality
Conference paper -
GDJ Smit
,
AJ Scholten
,
RMT Pijper
,
LF Tiemeijer
,
R. van der Toorn
,
D.B.M. Klaassen
,
P Scheer
,
A Juge