FEM study on the dependence of resonant frequency shift on mechanical stress of thin film resonator
Conference Paper
(2001)
Author(s)
SS Lee (TU Delft - Electronic Instrumentation)
R Kazinczi (TU Delft - Electronic Instrumentation)
J.R. Mollinger (TU Delft - Electronic Instrumentation)
MJ Vellekoop (TU Delft - Electronic Instrumentation)
Andre Bossche (TU Delft - Electronic Instrumentation)
Research Group
Electronic Instrumentation
To reference this document use:
https://resolver.tudelft.nl/uuid:5f4adb46-c4dd-425d-8d77-e4dbd2ddbfeb
More Info
expand_more
expand_more
Publication Year
2001
Research Group
Electronic Instrumentation
Pages (from-to)
817-820
ISBN (print)
90-73461-29-4
No files available
Metadata only record. There are no files for this record.