Confocal microscopy with a radially polarized focused beam
Peiwen Meng (TU Delft - ImPhys/Optics)
Silvania Pereira (TU Delft - ImPhys/Optics)
Paul Urbach (TU Delft - ImPhys/Optics)
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Abstract
Rigorous vectorial focusing theory is used to study the imaging of small adjacent particles with a confocal laser scanning system. We consider radially polarized illumination with an optimized amplitude distribution and an annular lens to obtain a narrower distribution of the longitudinal component of the field in focus. A polarization convertor at the detector side is added to transform radial polarization to linear polarization in order to make the signal detectable with a single mode fiber.