Hardware Modification Free Active 3D-Drift Correction in Single-Molecule Localization Microscopy (SMLM)

Model-Based Control of a Super Resolution Microscope

Master Thesis (2025)
Author(s)

K.E. Blokhuis (TU Delft - Mechanical Engineering)

Contributor(s)

Carlas Smith – Mentor (TU Delft - Team Carlas Smith)

L. Cools – Mentor (TU Delft - Team Carlas Smith)

R. P. Tas – Mentor (TU Delft - Biomaterials & Tissue Biomechanics)

A. Accardo – Mentor (TU Delft - Micro and Nano Engineering)

D. Kromm – Mentor (TU Delft - Support Delft Center for Systems and Control)

Faculty
Mechanical Engineering
More Info
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Publication Year
2025
Language
English
Graduation Date
2025
Awarding Institution
Delft University of Technology
Programme
['Mechanical Engineering | Systems and Control']
Faculty
Mechanical Engineering
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Abstract

Single-molecule localization microscopy (SMLM) enables imaging at nanometer-scale resolution but is highly sensitive to sample drift. Here, I present a live 3D drift correction approach that uses only fiducial markers and does not require any hardware modifications. The method uses fluorescent light from fiducial markers, extracted directly from the main imaging camera during acquisition. Using the computationally efficient Phasor approach to estimate the 3D-position of the beads \cite{phasor}, the control bandwidth is mostly limited by the maximum frame rate of the camera during acquisition (e.g. rates of >22 Hz at 25 fps). In addition, a system identification framework is proposed to identify drift dynamics, enabling the implementation of an optimal model-based control strategy. Experiments reached closed-loop stability with a precision of 0.6 nm in lateral direction and 2.4 nm in axial direction, showing the potential of the hardware-free drift correction approach.

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