Base-band impedance control and calibration for on-wafer linearity measurements
Conference Paper
(2004)
Author(s)
M Pelk (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
LCN de Vreede (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
M Spirito (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
HFF Jos (External organisation)
Research Group
Old - EWI Ch. Integrated Sensing Devices
To reference this document use:
https://resolver.tudelft.nl/uuid:63aeb630-88f2-4942-b403-b17180240c90
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Publication Year
2004
Research Group
Old - EWI Ch. Integrated Sensing Devices
Pages (from-to)
1-6
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