Base-band impedance control and calibration for on-wafer linearity measurements

Conference paper (2004)

Authors

M.J. Pelk Old - EWI Ch. Integrated Sensing Devices
L.C.N. de Vreede Old - EWI Ch. Integrated Sensing Devices
M. Spirito Old - EWI Ch. Integrated Sensing Devices
HFF Jos External organisation
Research Group
Old - EWI Ch. Integrated Sensing Devices
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Published Date

2004

Language

Undefined/Unknown

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Research Group

Old - EWI Ch. Integrated Sensing Devices