Substrate resistance modeling by combination of BEM and FEM technologies
Conference Paper
(2002)
Author(s)
E. Schrik (TU Delft - Signal Processing Systems)
Nick van der Meijs (TU Delft - Signal Processing Systems)
Research Group
Signal Processing Systems
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https://resolver.tudelft.nl/uuid:64a2b00d-b85a-4bb7-b48b-f39469ae0945
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Publication Year
2002
Research Group
Signal Processing Systems
Pages (from-to)
171-172
ISBN (print)
90-9015894-4
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